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Примеры применений

Application Note 098
  • Piezoresponse force microscopy of soft, loose and fragile samples

  • Simultaneous study of morphological, nanomechanical, adhesive and piezoresponse propertiess

  • Real-time study of temperature dynamics of electromechanical properties

Application Note 097  (6 Mb)
Size: A4  or Letter
  • Compositional imaging of heterogeneous materials with AFM is one of invaluable applications of this method in academy and industry.
  • Visualization of specific structures and probing of local properties (mechanical, electric, thermal, spectroscopic, etc.) are employed for AFM compositional imaging.
  • Experimental data on polymer blends and bitumen illustrate the high-resolution mapping of different components of complex materials.
Application Note 096  (2,4 Mb)
Size: A4  or Letter
  • Contact mode, introduced 30 years ago, is the pioneering AFM technique that is still a valuable partner for other methods
  • Local mechanical studies in contact mode are demonstrated on polymer blends
  • Mapping of electrostatic force response in contact mode helps to characterize the electrically-active materials
Application Note 095  (2,4 Mb)
Size: A4  or Letter
  • A set of oscillatory resonance AFM modes is expanded with frequency modulation mode and frequency imaging in amplitude modulation mode.
  • Frequency modulation mode provides a superior capability in imaging at broad force range and enhances studies at low probe-sample forces.
  • Frequency imaging in amplitude modulation provides the elastic modulus-related contrast and substantially complements the phase imaging in visualization of surface structures and compositional imaging of heterogeneous materials.
Application Note 094  (2 Mb)
Size: A4 or Letter

AFM recognition of the individual components in heterogeneous polymer materials is usually based on their specific morphology and differences of local mechanical and electric properties. Nowadays a deficit of local chemical or spectral information in AFM can be overcome by combining it with confocal aman scattering microscopy. Such applications to polymer blends are fast developing and can be substantially enhanced with the use of multifrequency AFM techniques, which allow the simultaneous recording of surface morphology, local mechanical, dielectric and chemical (Raman pectra) responses from the same sample area. 

Application Note 093  (2,2 Mb)
Size: A4 or Letter 
Development of advanced lithium batteries currently represents a very rapidly growing field of science and technology. Lithium batteries are interesting as a power source in numerous portable devices such as notebook computers, cellular phones and camcorders, in electrical vehicles, in military and aerospace applications.
AFM-Raman Characterization of Pharmaceutical Tablets
Application Note 092  (1,9 Mb)
Size: A4 or Letter 
Raman microscopy is a widely used technique in pharmaceutical industry. It allows identifying and rapidly characterizing chemical compounds, functional groups, molecular conformers, and authenticating various drugs.
Solar Cell Diagnostics by Combination of Kelvin Probe Force Microscopy with Local Photoexitation
Application Note 091  (1,5 Mb)
Size: A4 or Letter 
The Sun is an abundant, easily accessible power source that is currently underutilized, will possibly become the no-alternative choice for electrical power of humankind. It is believed that the most promising way to convert solar power is by the photoelectric method used in solar cells (SCs).
Application Note 090  (1,6 Mb)
Size: A4 or Letter 
  • Quantitative nanomechanical measurements of polyme r samples in HybriD mode sho wed that the local elastic moduli c orrelate well to their macroscopic values.
  • Maps of elas tic modulus w ere successfully applied for compositional mapping of immiscible polymer blends.
  • High spatial resolution of the e lastic modulus mapping w as demonstrated on polymers with w elldefined lamellar s tructures.
Characterization of Materials with a Combined AFM/Raman Microscope
Application Note 089  (3,6 Mb)
Size: A4 or Letter 
Comprehensive materials characterization relies on studies of samples by complementary techniques. A need for chemical recognition of compounds at the microscopic scale led to the development of IR and Raman microscopes. The identification of the components of multicomponent materials and mapping their distribution ecomes difficult as the size of technologic structures shrinks to the sub-micron and sub-100 nm scales.
High-Resolution Imaging in Different Atomic Force Microscopy Modes
Application Note 088  (2,4 Mb)
Size: A4 or Letter 
  • An operation of AFM microscope in a temperature-stable cabinet facilitates high-resolution studies and makes molecular-scale imaging of different materials a routine procedure.
  • The imaging at the atomic and molecular scale has been achieved on a number of samples not only in contact mode but also in the oscillatory resonant (Amplitude Modulation) and non-resonant (HybriD) modes.
  • The tip-sample force interactions, which are different in the various AFM modes, help to visualize numerous types of adsorbate structures with the weakly-bonded adsorbates seen only in the oscillatory resonant mode.
Expanding Atomic Force Microscopy with HybriD Mode Imaging
Application Note 087  (8,8 Mb)
Size: A4 or Letter 
  • Enhanced visualization of nanoscale structures - one of remarkable features of the HybriD Mode.
  • High-resolution mapping of local adhesion and stiffness in the HybriD Mode expands AFM compositional mapping of heterogeneous materials and transforms it into quantitative analysis of local mechanical properties.
  • A combination of HybriD Mode with multi-frequency capabilities of the resonant AFM techniques is the basic of comprehensive material characterization at the nanoscale.
Application Note 086  (4,8 Mb)
Size: A4 or Letter 
  • Achieving molecular-resolution in the intermittent contact mode
  • Enhancement of surface visualization with a force control
  • Metrological aspects of profiling of rough surfaces
Exploring Nanomechanical Properties of Materials with Atomic Force Microscopy
Application Note 085  (6,5 Mb)
Size: A4 or Letter 
  • Force effects in Atomic Force Microscopy imaging and spectroscopy
  • Contact resonance, phase imaging, dissipation, and bimodal excitation
  • Quantitative Atomic Force Microscopy–based nanoindentation
Exploring Materials with AFM-based Electrostatic Modes
Application Note 084  (8,4 Mb)
Size: A4 or Letter 
  • Electrostatic Force Microscopy: Experiments and quantitative analysis
  • Local surface potential studies with single-pass Kelvin Probe Force Microscopy
  • Broad range applications: From organic photovoltaics to metals and semiconductors
Piezoresponse Force Microscopy in Its Applications
Application Note 083  (11,1 Mb)
Size: A4 or Letter 
Atomic force microscopy (AFM) is routinely applied for compositional mapping of heterogeneous polymer materials. Recognition of the individual components in these materials is usually based on their specific morphology and differences of local mechanical and electric properties.
Application Note 082  (2,8 Mb)
Size: A4
Sensitive measurements of local electrical properties, with a few nanometers spatial resolution, were realized in practice through phase modulation detection of the electrostatic force gradient. The validity of this approach is demonstrated on several different sample types: self-assemblies of fluoroalkanes, polymers, metals, and semiconductors. The obtained results have proved the utility of surface potential and dielectric response for compositional mapping of heterogeneous materials. The issues of quantitative surface potential studies are also discussed. Ultimately we introduce a novel approach to extracting the dielectric permittivity values from AFM data.
New Capabilities of NT-MDT AFM Microscopes: Single-Pass Electrostatic Measurements
Application Note 081  (2 Mb)
Size: A4 or Letter 

Multi-frequency Measurements
  • Broad frequency range
         Up to 5MHz for photodetector and 3 lock-in amplifiers
  • Amplitude/Phase Modulation detection of electrostatic tip sample interactions
  • Simultaneous measurement
    Dielectric Response
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