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Примеры применений

  • Single-pass Electrostatic Measurements: New Capabilities of NT-MDT AFM Microscopes AN 081  (786 Kb)
    Size: A4 or Letter
  • Single-Pass Measurements in Atomic Force Microscopy: Kelvin Probe Force Microscopy and Local Dielectric
    Studies AN 082
    (2,12 Mb)
    Size: A4 or Letter
  • Piezoresponse Force Microscopy in Its Applications AN 083  (1,86 Mb)
    Size: A4 or Letter
  • Exploring Materials with AFM-based Electrostatic Modes AN 084  (2,12 Mb)
    Size: A4 or Letter
  • Exploring Nanomechanical Properties of Materials with Atomic Force Microscopy AN 085  (1,58 Mb)
    Size: A4 or Letter
  • Next Scanning Probe Microscope: Visualization of Surface Nanostructures and Morphology AN 086  (1,87 Mb)
    Size: A4 or Letter
  • Expanding AFM with HybriD Mode Imaging AN 087  (2,71 Mb)
    Size: A4 or Letter
  • High-Resolution Imaging in Different Atomic Force Microscopy Modes. Summary AN 088s  (1,13 Mb)
    Size: A4 or Letter
  • High-Resolution Imaging in Different Atomic Force Microscopy Modes AN 088  (1,73 Mb)
    Size: A4 or Letter
  • Characterization of Materials with a Combined AFM/Raman Microscope. Summary AN 089s  (0,99 Mb)
    Size: A4 or Letter
  • Characterization of Materials with a Combined AFM/Raman Microscope AN 089  (1,18 Mb)
    Size: A4 or Letter
  • Quantitative Nanomechanical Measurements in HybriD Mode Atomic Force Microscopy AN 090  (1,71 Mb)
    Size: A4 or Letter
  • Solar Cell Diagnostics by Combination of Kelvin Probe Force Microscopy with Local Photoexitation
    AN 091
    (0,7 Mb)
    Size: A4 or Letter
  • AFM-Raman Characterization of Pharmaaceutical Tablets AN 092  (0,7 Mb)
    Size: A4 or Letter
  • AFM – Raman Characterization of Li-ion Batteries AN 093  (1,19 Mb)
    Size: A4 or Letter
  • Interplay between Raman Scattering and Atomic Force Microscopy in Characterization of Polymer
    Blends AN 094
     (0,9 Mb)
    Size: A4 or Letter
  • Exploring Imaging in Oscillatory Resonance AFM Modes: Backgrounds and Applications AN 095  (2,4 Mb)
    Size: A4  or Letter
  • Atomic Force Microscopy Studies of Mechanical and Electric Properties in the Contact Mode AN 096  (0,9 Mb)
    Size: A4
  • Comprehensive Compositional Imaging of Heterogeneous Materials with Atomic Force Microscopy AN 097  (1,6 Mb)
    Size: A4
 
 
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