СЗМ Раман Нано ИК системы
Модульные СЗМ
Автоматизированные СЗМ
Специализированные СЗМ

Терминология СЗМ

Maxwell-stress microscopy

The advantage of Maxwell-stress microscopy comes from the use of the second-harmonic electric-field-induced oscillation of the cantilever for controlling the tip-surface distance. This scheme automatically establishes a point of reference for electrical measurements in terms of the tip-surface capacitance, thereby insuring that the observed contrast is always free from the influences of the sample topography.
J. Vac. Sci. Technol. B 14, 2105 (1996).

Micro Differential Thermal Analysis

Magnetic Force Microscopy
Appl. Phys. Lett. 50, 1455 (1987).
Manipulation Force Microscopy The manipulation force microscope is a novel atomic force microscope adapted to measuring the force necessary to displace micron-size samples adhering to surfaces. It has successfully characterized the adhesion of both proteins and living cells to substrates. This instrument enables measurement of samples not previously accessible to atomic force microscopes.
Rev. Sci. Instrum. 70, 2769 (1999).

Molecular Force Probe
an attempt of SPM operation modes systematisation.
Magnetic Resonance Force Microscopy.
Magnetic STM
Phys. Rev. Lett. 79, 4593-4596 (1997).

Micro-Thermo Mechanical Analysis
Micro-Thermo Mechanical Analysis (µTMA) senses changes in a material's mechanical properties by monitoring probe displacement as a function of temperature.

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