NT-MDT SI Participates at E-MRS Fall Meeting and Exhibit 2017


NT-MDT Spectrum Instruments were proud to participate at E-MRS Fall Meeting 2017 Warsaw, Poland September 18th – 21st. From cutting edge scientific research to routine surface investigations, NT-MDT Spectrum Instruments has a unique and unrivalled portfolio of Scanning Probe Microscopes. Our application-focused instruments provide you with a full range of capabilities in AFM-Raman, high-resolution, multi-frequency measurements, and AFM based nanomechanics.

The E-MRS Fall Meeting and Exhibit 2017 took place in Warsaw University of Technology. The conference consisted of 23 parallel symposia with invited speakers, oral and poster presentations and a plenary session to provide and international forum for discussing recent advances in the field of material science. NT-MDT Spectrum Instruments technical experts welcomed visitors at our Booth # 6, which provided the opportunity to discuss new developments and provide personal one to one discussions.

NT-MDT SI was also delighted to sponsor the Exhibitor Symposia “Scanning Probe Microscopy for energy applications”. This symposium gave attendees the opportunity to meet industry in a more personalized environment. Dr Stanislav Leesment delivered a talk titled “Material contrast mapping with nanometer resolution” which took place on Tuesday September 19th at 10:10am.

NT-MDT SI would like to take this opportunity to sincerely thank all those that visited our booth at E-MRS Fall 2017 and look forward to meeting you at future Events & Workshops.

To find out more information about Upcoming Events please follow this link http://www.ntmdt-si.com/


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