Scanning Spreading Resistance Microscopy (SSRM) on the surface of carbon black-silicon rubber composite. The left image is topography (contact mode), the right image is distribution of the current for the same area. The carbon black forms conductive net inside the silicon rubber matrix. By using conductive tip we can find places where this net appears on the matrix surface.
Sample courtesy of R. Neffati (TU/Eindhoven, The Netherlands).
For more detailes see: R. Nefatti, A. Alexeev, S. Saunin, J.C.M. Brokken-Zijp, D. Wouters, S. Schmatloch, U.S. Schubert, J. Loos, Automated scanning probe microscopy as a new tool for combinatorial polymer research: conductive carbon black / poly(dimethylsiloxane) composites, Macromol. Rapid Commun. 24 (2003), 113-117.