Dynamic AFM
Phys. Rev. B 60, 4961 (1999).


Dynamic Contact Mode Electrostatic Force Microscopy
By operating EFM in a contact mode with an ac modulation bias, one can to improve the spatial resolution and also to achieve a complete separation of the topographic effect from other electrostatic force effect overcoming the mixing problem of a topographic effect with other electrostatic effects frequently encountered in the conventional noncontact EFM measurement.
Rev. Sci. Instr. 70, 1735 (1999).

Dc Electrostatic Force Microscopy
In the dc-EFM, the AFM is operated in noncontact mode with the cantilever oscillated near its resonant frequency at a small fixed height above the sample. The changing electrostatic force with z gives a shift in the resonant frequency and the phase Df of the cantilever oscillation. The measured signal is thus proportional to the square of the dc voltage difference between the tip and the sample. In the second approach, called ac- EFM, the cantilever is made to oscillate by an ac potential
Phys. Rev. Lett. 84, 6082 (2000).


Dynamic Force Microscopy
Dissipation Force Microscopy
Design for Manufacturability


Dynamic Force Spectroscopy
DFS is a method of tip-sample interaction potentials determination. The method is based on the measurement of the resonance frequency as a function of the resonance amplitude of the oscillated cantilever.
Phys. Rev. Lett. 83, 4780 (1999).


Displacement Modulation Mode, see Force Modulation Mode


Dynamic Powing Lithography (Nanolithography) By dynamic plowing lithography the surface is modified by indenting it with a vibrating tip in the AFM tapping mode. This method provides a lithography technique that is nearly free from problems due to cantilever torsion and permits us to image the modified surface without any further modification.
Rev. Sci. Instr. 72, 136 (2001)


Dynamic Probe Microscopy SPM with laterally or normally to sample surface vibrating probe.
Appl. Phys. Lett. 76, 1203 (2000).

Dynamic Pecking Mode
In DPM sharp, conical, metallic tips oriented perpendicular to the axis of a rod vibrating in bending (pecking) mode are used as force sensors in scanned force probes and as optical scatterers in apertureless near-field optical microscopes.
Appl. Phys. Lett. 79, 2657 (2001).


Dual-probe STM Appl. Phys. Lett. 78, 2928 (2001).


deep trench


Distance tunnel spectroscopy Appl. Phys. A 66, № 7, S181 (1998).

Dual-Amplitude Mode

US Pat. 5907096