wear testing

Wear testing can be conducted by scratching the sample surface (or deposited on the substrate film) be the SPM tip and subsequent investigation of the arised trace.


Whisker or "Whisker-Type" tip is the carbonic needle deposited on the usual cantilever by the focused electron beam. "Whisker Type" tips go deeper inside narrow gaps when the standard cantilevers fail to measure the bottom and to control near vertical sidewalls.


Waveguide Ultrasonic Force Microscopy
Ultrasonic Force Microscopy with exitation of ultrasound from a piezo at the cantilever base.
Nanotechnology 12, 53 (2001).