Примеры применений

HybriD Piezoresponse Force Microscopy
Application Note 098
  • Piezoresponse force microscopy of soft, loose and fragile samples
  • Simultaneous study of morphological, nanomechanical, adhesive and piezoresponse propertiess
  • Real-time study of temperature dynamics of electromechanical properties
Comprehensive Compositional Imaging of Heterogeneous Materials
Application Note 097
Compositional imaging of heterogeneous materials with AFM is one of invaluable applications of this method in academy and industry.
Visualization of specific structures and probing of local properties (mechanical, electric, thermal, spectroscopic, etc.) are employed for AFM compositional imaging.
Atomic Force Microscopy Studies of Mechanical and Electric Properties in the Contact Mode
Application Note 096
Contact mode, introduced 30 years ago, is the pioneering AFM technique that is still a valuable partner for other methods
Local mechanical studies in contact mode are demonstrated on polymer blends
Mapping of electrostatic force response in contact mode helps to characterize the electrically-active materials
Exploring Imaging in Oscillatory Resonance AFM Modes: Backgrounds and Applications
Application Note 095
A set of oscillatory resonance AFM modes is expanded with frequency modulation mode and frequency imaging in amplitude modulation mode.
Frequency modulation mode provides a superior capability in imaging at broad force range and enhances studies at low probe-sample forces.
Interplay between Raman Scattering and Atomic Force Microscopy in Characterization of Polymer Blends
Application Note 094
AFM recognition of the individual components in heterogeneous polymer materials is usually based on their specific morphology and differences of local mechanical and electric properties. Nowadays a deficit of local chemical or spectral information in AFM can be overcome by combining it with confocal aman scattering microscopy.
AFM – Raman Characterization of Li-ion Batteries
Application Note 093
Development of advanced lithium batteries currently represents a very rapidly growing field of science and technology. Lithium batteries are interesting as a power source in numerous portable devices such as notebook computers, cellular phones and camcorders, in electrical vehicles, in military and aerospace applications.
AFM-Raman Characterization  of Pharmaceutical Tablets
Application Note 092
Raman microscopy is a widely used technique in pharmaceutical industry. It allows identifying and rapidly characterizing chemical compounds, functional groups, molecular conformers, and authenticating various drugs.
Solar Cell Diagnostics by Combination of Kelvin Probe Force Microscopy with Local Photoexitation
Application Note 091
The Sun is an abundant, easily accessible power source that is currently underutilized, will possibly become the no-alternative choice for electrical power of humankind. It is believed that the most promising way to convert solar power is by the photoelectric method used in solar cells (SCs).
Quantitative Nanomechanical Measurements in HybriD Mode Atomic Force Microscopy
Application Note 090
Quantitative nanomechanical measurements of polyme r samples in HybriD mode sho wed that the local elastic moduli c orrelate well to their macroscopic values.
Maps of elas tic modulus w ere successfully applied for compositional mapping of immiscible polymer blends.
Characterization of Materials with a Combined AFM/Raman Microscope
Application Note 089
Comprehensive materials characterization relies on studies of samples by complementary techniques. A need for chemical recognition of compounds at the microscopic scale led to the development of IR and Raman microscopes.
High-Resolution Imaging in Different Atomic Force Microscopy Modes
Application Note 088
An operation of AFM microscope in a temperature-stable cabinet facilitates high-resolution studies and makes molecular-scale imaging of different materials a routine procedure.
The imaging at the atomic and molecular scale has been achieved on a number of samples not only in contact mode but also in the oscillatory resonant (Amplitude Modulation) and non-resonant (HybriD) modes.
Expanding Atomic Force Microscopy with HybriD Mode Imaging
Application Note 087
Enhanced visualization of nanoscale structures - one of remarkable features of the HybriD Mode. High-resolution mapping of local adhesion and stiffness in the HybriD Mode expands AFM compositional mapping of heterogeneous materials and transforms it into quantitative analysis of local mechanical properties.
NEXT Scanning Probe Microscope: Visualization of Surface Nanostructures and of Morpholog
Application Note 086
  • Achieving molecular-resolution in the intermittent contact mode
  • Enhancement of surface visualization with a force control
  • Metrological aspects of profiling of rough surfaces
Exploring Nanomechanical Properties of Materials with Atomic Force Microscopy
Application Note 085
  • Force effects in Atomic Force Microscopy imaging and spectroscopy
  • Contact resonance, phase imaging, dissipation, and bimodal excitation
  • Quantitative Atomic Force Microscopy–based nanoindentation
Exploring Materials with AFM-based Electrostatic Modes
Application Note 084
Enhanced visualization of nanoscale structures - one of remarkable features of the HybriD Mode. High-resolution mapping of local adhesion and stiffness in the HybriD Mode expands AFM compositional mapping of heterogeneous materials and transforms it into quantitative analysis of local mechanical properties.
Piezoresponse Force Microscopy in Its Applications
Application Note 083
Atomic force microscopy (AFM) is routinely applied for compositional mapping of heterogeneous polymer materials. Recognition of the individual components in these materials is usually based on their specific morphology and differences of local mechanical and electric properties.
Single-Pass Measurements in Atomic Force  Microscopy: Kelvin Probe Force Microscopy and Local  Dielectric Studies
Application Note 082
Sensitive measurements of local electrical properties, with a few nanometers spatial resolution, were realized in practice through phase modulation detection of the electrostatic force gradient. The validity of this approach is demonstrated on several different sample types: self-assemblies of fluoroalkanes, polymers, metals, and semiconductors.
New Capabilities of NT-MDT AFM Microscopes: Single-Pass Electrostatic Measurements
Application Note 081
    Multi-frequency Measurements
  • Broad frequency range
  • Amplitude/Phase Modulation detection of electrostatic tip sample interactions
  • Simultaneous measurement
Measuring in vacuum and controlled atmosphere

Vacuum allows raising the Q-factor of cantilever oscillations, which, in its turn, substantially raises the sensitivity o light magnetic forces measurements between the probe and the sample.

Imaging of biological samples in liquid environment

This short review describes the possibilities of imaging of biological materials using atomic force microscopy (AFM) in liquid environment. Atomic force microscopy can give new insight on biological matter, because it can work in environment close to native for the living cells, bacteria and viruses.

События

2018 E-MRS Fall Meeting and Exhibit
Сентябрь, 17-20, 2018
NANO.IL.2018 conference & exhibition
Октябрь, 9-11, 2018
2018 MRS FALL MEETING & EXHIBIT
Ноябрь, 25-30, 2018

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