Nanoscale IR Microscopy and Spectroscopy

Nanoscale IR Microscopy and Spectroscopy


Vyacheslav Polyakov

Webinar took place on October 11, 2017.

Scattering near-field infrared microscopy (s-SNOM IR) is a quite known technique that allows to break the diffraction limit by confining the light on the nanometer scale using a suitable probe and achieve down to 10 nm spatial resolution. In the meantime, it is less known that the key to successful s-SNOM IR is a high resolution and highly stable Atomic Force Microscope (AFM), which precisely controls the position of the probe and detects signals from it.

NT-MDT SI is happy to present a unique system which combines latest developments in AFM and s-SNOM techniques, called NTEGRA Nano IR – the most advanced system for Nanoscale IR Microscopy and Spectroscopy. In this webinar we show how the combination of low thermal drift and low noise AFM in combination with s-SNOM IR and other nearfield techniques helps to obtain perfect high resolution results on various samples.

Nanoscale IR Microscopy and Spectroscopy webinar presentation

Video at YOUKU.COM

Остались вопросы? Позвоните нам по телефону: +7-499-110-2050
или заполните форму обратной связи, и мы ответим на все интересующие Вас вопросы.